Compartir
Scientific Researches in Atomic Force Microscopy
Ny Research Press (Autor)
·
Ny Research Press
· Tapa Dura
Scientific Researches in Atomic Force Microscopy - Ny Research Press
Sin Stock
Te enviaremos un correo cuando el libro vuelva a estar disponible
Reseña del libro "Scientific Researches in Atomic Force Microscopy"
This book elucidates the scientific researches in the field of atomic force microscopy. The invention of the atomic force microscope (AFM) brought about drastic changes in the field of surface analysis. It proved to be a critical investigative resource and method, used for qualitative and quantitative study of surfaces with sub-nanometer resolutions. Additionally, samples analyzed through this microscope don't need prior preparation procedures. This prevents any alterations or adverse effects which may damage the sample while allowing a three dimensional study of the exterior surface. This book presents latest work by masters of this method across the globe. This method has found ready acceptance in procuring important information in a diverse spectrum of fields. Since its inception in 1986, it has found multiple uses across manufacturing, research and advancement fields.
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
Todos los libros de nuestro catálogo son Originales.
El libro está escrito en Inglés.
La encuadernación de esta edición es Tapa Dura.
✓ Producto agregado correctamente al carro, Ir a Pagar.