progress in pattern recognition, image analysis and applications,10th iberoamerican congress on pattern recognition, ciarp 2005, havana, cuba, november 15-18, 2005,
alberto (edt) sanfeliu
progress in pattern recognition, image analysis and applications,10th iberoamerican congress on pattern recognition, ciarp 2005, havana, cuba, november 15-18, 2005,
Alberto (Edt) Sanfeliu (Autor) · springer-verlag new york inc · Libro Físico
Sin Stockprogress in pattern recognition, image analysis and applications,10th iberoamerican congress on pattern recognition, ciarp 2005, havana, cuba, november 15-18, 2005,
alberto (edt) sanfeliu
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