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Scaling Effects on Metal-Oxide-Semiconductor Device Characteristics
Steven Walstra (Autor)
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Scaling Effects on Metal-Oxide-Semiconductor Device Characteristics - Steven Walstra
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Reseña del libro "Scaling Effects on Metal-Oxide-Semiconductor Device Characteristics"
Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Scaling Effects on Metal-oxide-semiconductor Device Characteristics" by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.
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